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    DATE
    2004
    IEEE
    120views Hardware» more  DATE 2004»
    Pattern Selection for Testing of Deep Sub-Micron Timing Defects
    13 years 8 months ago
    Pattern Selection for Testing of Deep Sub-Micron Timing Defects
    Download  cadlab.ece.ucsb.edu
    Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
    Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng
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