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    GLVLSI
    2006
    IEEE
    95views VLSI» more  GLVLSI 2006»
    Test generation using SAT-based bounded model checking for validation of pipelined processors
    13 years 11 months ago
    Test generation using SAT-based bounded model checking for validation of pipelined processors
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    Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
    Heon-Mo Koo, Prabhat Mishra
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