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    DATE
    2003
    IEEE
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    A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories
    13 years 10 months ago
    A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories
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    In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-achip (SOC) environment. The main novelty of the approach is the...
    Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza ...
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