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DATE
2003
IEEE

A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories

13 years 9 months ago
A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories
In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-achip (SOC) environment. The main novelty of the approach is the high flexibility, which guarantees easy exploitation of the same architecture to different memory cores. The proposed approach is compatible with the P1500 standard. A case study has been developed and demonstrates the advantages of the proposed core test strategy in terms of area overhead and test application time.
Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where DATE
Authors Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante
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