Sciweavers

DAC
1999
ACM
13 years 9 months ago
Test Generation for Gigahertz Processors Using an Automatic Functional Constraint Extractor
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. ...