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IOLTS
2005
IEEE
206views Hardware» more  IOLTS 2005»
13 years 10 months ago
A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir
SP
2006
IEEE
109views Security Privacy» more  SP 2006»
13 years 10 months ago
Integrity (I) Codes: Message Integrity Protection and Authentication Over Insecure Channels
Inspired by unidirectional error detecting codes that are used in situations where only one kind of bit errors are possible (e.g., it is possible to change a bit “0” into a bi...
Mario Cagalj, Jean-Pierre Hubaux, Srdjan Capkun, R...
DATE
2006
IEEE
121views Hardware» more  DATE 2006»
13 years 10 months ago
Analysis of the impact of bus implemented EDCs on on-chip SSN
In this paper we analyze the impact of error detecting codes, implemented on an on-chip bus, on the on-chip simultaneous switching noise (SSN). First, we analyze in detail how SSN...
Daniele Rossi, Carlo Steiner, Cecilia Metra
DATE
2007
IEEE
119views Hardware» more  DATE 2007»
13 years 11 months ago
Experimental evaluation of protections against laser-induced faults and consequences on fault modeling
Lasers can be used by hackers to situations to inject faults in circuits and induce security flaws. On-line detection mechanisms are classically proposed to counter such attacks, ...
Régis Leveugle, Abdelaziz Ammari, V. Maingo...