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    VTS
    2007
    IEEE
    79views Hardware» more  VTS 2007»
    Using Multiple Expansion Ratios and Dependency Analysis to Improve Test Compression
    13 years 11 months ago
    Using Multiple Expansion Ratios and Dependency Analysis to Improve Test Compression
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    A methodology is presented for improving the amount of compression achieved by continuous-flow decompressors by using multiple ratios of scan chains to tester channels (i.e., expa...
    Richard Putman, Nur A. Touba
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