ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
In this paper, we develop a method to analyze the probability of access failure in SRAM array (due to random Vt variation in transistors) by jointly considering variations in cell...
INFOCOM
2007
IEEE
13 years 11 months ago
2007
IEEE
We consider the problem of reliable broadcast in a wireless network in which nodes are prone to failure. In the failure mode considered in this paper, each node can fail independe...