GLVLSI
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...