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ATS
2009
IEEE
162views Hardware» more  ATS 2009»
13 years 11 months ago
Multi-tone Testing of Linear and Nonlinear Analog Circuits Using Polynomial Coefficients
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
Suraj Sindia, Virendra Singh, Vishwani D. Agrawal