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ASPDAC
2006
ACM
144views Hardware» more  ASPDAC 2006»
13 years 11 months ago
Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahas...