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IOLTS
2008
IEEE
83views Hardware» more  IOLTS 2008»
13 years 12 months ago
Yield Improvement, Fault-Tolerance to the Rescue?
With the technology entering the nano dimension, manufacturing processes are less and less reliable, thus drastically impacting the yield. A possible solution to alleviate this pr...
Julien Vial, Alberto Bosio, Patrick Girard, Christ...