FTRTFT
2000
Springer
13 years 8 months ago
2000
Springer
Formal methods can improve the development of systems with high quality requirements, since they usually o er a precise, nonambiguous speci cation language and allow rigorous veri ...
MTDT
2003
IEEE
13 years 10 months ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
Abstract: Fabrication process improvements and technology scaling results in modifications in the characteristics and in the behavior of manufactured memory chips, which also modi...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Abstract: DRAMs play an important role in the semiconductor industry, due to their highly dense layout and their low price per bit. This paper presents the first framework of faul...