Sciweavers

ITC
1998
IEEE
77views Hardware» more  ITC 1998»
13 years 9 months ago
Deterministic BIST with multiple scan chains
A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a pattern generator which stimulates all scan chains simu...
Gundolf Kiefer, Hans-Joachim Wunderlich