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DFT
2004
IEEE
114views VLSI» more  DFT 2004»
13 years 8 months ago
Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS)
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault...
Michelle L. La Haye, Glenn H. Chapman, Cory Jung, ...