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    ATS
    2009
    IEEE
    138views Hardware» more  ATS 2009»
    Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks
    13 years 11 months ago
    Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks
    Download  www.cse.cuhk.edu.hk
    Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
    Yubin Zhang, Lin Huang, Feng Yuan, Qiang Xu
    claim paper
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