ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper develops an improved approach for hierarchical functional test generation for complex chips. In order to deal with the increasing complexity of functional test generati...