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ATS
2004
IEEE
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13 years 8 months ago
Hybrid BIST Test Scheduling Based on Defect Probabilities
1 This paper describes a heuristic for system-on-chip test scheduling in an abort-on-fail context, where the test is terminated as soon as a defect is detected. We consider an hybr...
Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles