ICCD
2005
IEEE
13 years 10 months ago
2005
IEEE
ICCD
2005
IEEE
13 years 10 months ago
2005
IEEE
Nanoelectronic devices are expected to have extremely high and variable fault rates; thus future processor architectures based on these unreliable devices need to be built with fa...
ICCD
2005
IEEE
13 years 10 months ago
2005
IEEE
As power density increases exponentially, run-time regulation of operating temperature by dynamic thermal management becomes imperative. This paper proposes a novel approach to re...
ICCD
2005
IEEE
13 years 10 months ago
2005
IEEE
— With the success of formal verification techniques like equivalence checking and model checking for hardware designs, there has been growing interest in applying such techniqu...
ICCD
2005
IEEE
13 years 10 months ago
2005
IEEE
ICCD
2005
IEEE
13 years 10 months ago
2005
IEEE
— In this work we investigate the buffer insertion problem under process variations. Sub 100-nm fabrication process causes significant variations on many design parameters. We p...
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
Bulk data movement occurs commonly in server workloads and their performance is rather poor on today’s microprocessors. We propose the use of small dedicated copy engines, and p...
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
— Since rapid progress has been made in device improvement and integration of small carbon nanotube fieldeffect transistors (CNFETs) circuits, the time has come for developing c...
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
Recent advances in Dynamic Power Management (DPM) techniques have resulted in designs that support a rich set of power management options, both at the hardware and software levels...
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
Presently, Architecture Description Languages (ADLs) are widely used to raise the abstraction level of the design space exploration of Application Specific Instruction-set Proces...