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    ICCAD
    1999
    IEEE
    72views Hardware» more  ICCAD 1999»
    Validation and test generation for oscillatory noise in VLSI interconnects
    13 years 9 months ago
    Validation and test generation for oscillatory noise in VLSI interconnects
    Download  poisson.usc.edu
    : Inductance of on-chip interconnects gives rise to signal overshoots and undershoots that can cause logic errors. By considering technology trends, we show that in 0.13
    Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer
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