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    ITC
    1994
    IEEE
    136views Hardware» more  ITC 1994»
    An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
    13 years 8 months ago
    An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
    Download  www.cad.polito.it
    Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
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    ITC
    1994
    IEEE
    82views Hardware» more  ITC 1994»
    Making the Circular Self-Test Path Technique Effective for Real Circuits
    13 years 8 months ago
    Making the Circular Self-Test Path Technique Effective for Real Circuits
    Download  www.cad.polito.it
    Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda
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    ITC
    1994
    IEEE
    151views Hardware» more  ITC 1994»
    Automated Logic Synthesis of Random-Pattern-Testable Circuits
    13 years 8 months ago
    Automated Logic Synthesis of Random-Pattern-Testable Circuits
    Download  crc.stanford.edu
    Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
    Nur A. Touba, Edward J. McCluskey
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    ITC
    1994
    IEEE
    111views Hardware» more  ITC 1994»
    Simulation Results of an Efficient Defect-Analysis Procedure
    13 years 8 months ago
    Simulation Results of an Efficient Defect-Analysis Procedure
    Download  www.iti.uni-stuttgart.de
    For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...
    Olaf Stern, Hans-Joachim Wunderlich
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    ITC
    1994
    IEEE
    99views Hardware» more  ITC 1994»
    Transparent Memory Testing for Pattern-Sensitive Faults
    13 years 8 months ago
    Transparent Memory Testing for Pattern-Sensitive Faults
    Download  mark.bu.edu
    Mark G. Karpovsky, Vyacheslav N. Yarmolik
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    ITC
    1994
    IEEE
    90views Hardware» more  ITC 1994»
    Defect Classes - An Overdue Paradigm for CMOS IC
    13 years 8 months ago
    Defect Classes - An Overdue Paradigm for CMOS IC
    Download  www.itcprogramdev.org
    : The IC test industry has struggled .for more than 30years to establish a test approach that would guarantee a low defect level to the customer. Wepropose a comprehensive strategy...
    Charles F. Hawkins, Jerry M. Soden, Alan W. Righte...
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    ITC
    1994
    IEEE
    60views Hardware» more  ITC 1994»
    Transforming Behavioral Specifications to Facilitate Synthesis of Testable Designs
    13 years 8 months ago
    Transforming Behavioral Specifications to Facilitate Synthesis of Testable Designs
    Download  www.cs.ucla.edu
    Sujit Dey, Miodrag Potkonjak
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