Sciweavers

GLVLSI
2003
IEEE
132views VLSI» more  GLVLSI 2003»
13 years 10 months ago
A highly regular multi-phase reseeding technique for scan-based BIST
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan c...
Emmanouil Kalligeros, Xrysovalantis Kavousianos, D...