ISQED
2005
IEEE
13 years 10 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
EWSN
2007
Springer
14 years 4 months ago
2007
Springer
This paper presents two lifetime models that describe two of the most common modes of operation of sensor nodes today, triggerdriven and duty-cycle driven. The models use a set of ...