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    DAC
    2009
    ACM
    133views Computer Architecture» more  DAC 2009»
    Statistical reliability analysis under process variation and aging effects
    14 years 5 months ago
    Statistical reliability analysis under process variation and aging effects
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    Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
    Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
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