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    DAC
    2005
    ACM
    132views Computer Architecture» more  DAC 2005»
    Logic soft errors in sub-65nm technologies design and CAD challenges
    13 years 6 months ago
    Logic soft errors in sub-65nm technologies design and CAD challenges
    Download  www.cs.york.ac.uk
    Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
    Subhasish Mitra, Tanay Karnik, Norbert Seifert, Mi...
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