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    DAC
    1996
    ACM
    131views Computer Architecture» more  DAC 1996»
    Test Point Insertion: Scan Paths through Combinational Logic
    13 years 8 months ago
    Test Point Insertion: Scan Paths through Combinational Logic
    Download  www.cs.york.ac.uk
    We propose a low-overhead scan design methodology which employs a new test point insertion technique to establish scan paths through the functional logic. The technique re-uses th...
    Chih-Chang Lin, Malgorzata Marek-Sadowska, Kwang-T...
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