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    ICCAD
    1995
    IEEE
    167views Hardware» more  ICCAD 1995»
    A novel methodology for statistical parameter extraction
    13 years 8 months ago
    A novel methodology for statistical parameter extraction
    Download  www.cecs.uci.edu
    IC manufacturing process variations are typically expressed in terms of joint probability density functions (jpdf’s) or as worst case combinations/corners of the device model pa...
    Kannan Krishna, Stephen W. Director
    claim paper
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