INTEGRATION
2007
13 years 4 months ago
2007
This tutorial paper describes different approaches to modeling and simulation of mixed-technology microsystems that consist of electrical circuits connected to subsystems describe...
DATE
2010
IEEE
13 years 6 months ago
2010
IEEE
Due to fast technology scaling, negative bias temperature instability (NBTI) has become a major reliability concern in designing modern integrated circuits. In this paper, we prese...
ISQED
2006
IEEE
13 years 10 months ago
2006
IEEE
It is well known that SRAM constitutes a large portion of modern integrated circuits, with 80% or more of the total transistors being dedicated to SRAM in a typical processor or S...