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ISQED   2006 International Symposium on Quality Electronic Design
Wall of Fame | Most Viewed ISQED-2006 Paper
ISQED
2006
IEEE
259views Hardware» more  ISQED 2006»
10 years 4 months ago
Impact of NBTI on SRAM Read Stability and Design for Reliability
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
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