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    2010
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    Applications of TEM imaging, analysis and electron holography to III-nitride HEMT devices
    12 years 11 months ago
    Applications of TEM imaging, analysis and electron holography to III-nitride HEMT devices
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    David J. Smith, David A. Cullen, Lin Zhou, Martha ...
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    MR
    2010
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    Parameter selection for health monitoring of electronic products
    13 years 3 months ago
    Parameter selection for health monitoring of electronic products
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    Sachin Kumar, Eli Dolev, Michael Pecht
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    MR
    2010
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    Modeling of board-level package by Finite Element Analysis and laser interferometer measurements
    13 years 3 months ago
    Modeling of board-level package by Finite Element Analysis and laser interferometer measurements
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    Bo Zhang, PinKuan Liu, Han Ding, Wenwu Cao
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    MR
    2010
    193views Robotics» more  MR 2010»
    A prognostics and health management roadmap for information and electronics-rich systems
    13 years 3 months ago
    A prognostics and health management roadmap for information and electronics-rich systems
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    Michael Pecht, Rubyca Jaai
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    MR
    2010
    105views Robotics» more  MR 2010»
    Design of differential low-noise amplifier with cross-coupled-SCR ESD protection scheme
    13 years 3 months ago
    Design of differential low-noise amplifier with cross-coupled-SCR ESD protection scheme
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    Chun-Yu Lin, Ming-Dou Ker, Yuan-Wen Hsiao
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    MR
    2010
    120views Robotics» more  MR 2010»
    Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy
    13 years 3 months ago
    Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy
    Download  www.pva-analyticalsystems.com
    Industrial applications often require failure analysis methods working non-destructively, enabling either a rapid quality control or fault isolation and defect localization prior ...
    S. Brand, P. Czurratis, P. Hoffrogge, M. Petzold
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