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MR
2010
219views Robotics» more  MR 2010»
10 years 5 months ago
Applications of TEM imaging, analysis and electron holography to III-nitride HEMT devices
David J. Smith, David A. Cullen, Lin Zhou, Martha ...
MR
2010
158views Robotics» more  MR 2010»
10 years 8 months ago
Parameter selection for health monitoring of electronic products
Sachin Kumar, Eli Dolev, Michael Pecht
MR
2010
120views Robotics» more  MR 2010»
10 years 8 months ago
Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy
Industrial applications often require failure analysis methods working non-destructively, enabling either a rapid quality control or fault isolation and defect localization prior ...
S. Brand, P. Czurratis, P. Hoffrogge, M. Petzold
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