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ICCAD
2008
IEEE
98views Hardware» more  ICCAD 2008»
14 years 1 months ago
Statistical path selection for at-speed test
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
Vladimir Zolotov, Jinjun Xiong, Hanif Fatemi, Chan...