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    2003
    IEEE
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    Impact of Multiple-Detect Test Patterns on Product Quality
    13 years 10 months ago
    Impact of Multiple-Detect Test Patterns on Product Quality
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    This paper presents the impact of multiple-detect test patterns on outgoing product quality. It introduces an ATPG tool that generates multiple-detect test patterns while maximizi...
    Brady Benware, Chris Schuermyer, Sreenevasan Ranga...
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