ITC
1992
IEEE
13 years 9 months ago
1992
IEEE
This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies. The technique is used to improve performance testing...
ICCAD
2007
IEEE
14 years 1 months ago
2007
IEEE
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...