VLSISP
2008
13 years 4 months ago
2008
The study of Multiple Soft errors on memory modules caused by radiation effects represents an interesting field of current research. The fault tolerance of these devices in radiati...
DSD
2009
IEEE
13 years 11 months ago
2009
IEEE
Feature sizes in VLSI circuits are steadily shrinking. This results in increasing susceptibility to soft errors, e.g. due to environmental radiation. Precautions against soft error...