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    2000
    IEEE
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    Detection of CMOS Defects under Variable Processing Conditions
    13 years 9 months ago
    Detection of CMOS Defects under Variable Processing Conditions
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    Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
    Amy Germida, James F. Plusquellic
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