Sciweavers

VLSID
2007
IEEE
94views VLSI» more  VLSID 2007»
14 years 5 months ago
A Reduced Complexity Algorithm for Minimizing N-Detect Tests
? We give a new recursive rounding linear programming (LP) solution to the problem of N-detect test minimzation. This is a polynomialtime solution that closely approximates the exa...
Kalyana R. Kantipudi, Vishwani D. Agrawal