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    ITC
    1996
    IEEE
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    Orthogonal Scan: Low-Overhead Scan for Data Paths
    13 years 8 months ago
    Orthogonal Scan: Low-Overhead Scan for Data Paths
    Download  www-crc.stanford.edu
    Orthogonal scan paths, which follow the path of the data flow, can be used in data path designs to reduce the test overhead -- area, delay and test application time -- by sharing ...
    Robert B. Norwood, Edward J. McCluskey
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