Sciweavers

    VTS
    2005
    IEEE
    96views Hardware» more  VTS 2005»
    Pseudo-Functional Scan-based BIST for Delay Fault
    13 years 10 months ago
    Pseudo-Functional Scan-based BIST for Delay Fault
    Download  cadlab.ece.ucsb.edu
    This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
    Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng
    claim paper
    Read More »
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    International On-screen Keyboard Graphical Social Symbols OCR Text Recognition CSS3 Style Generator Web Page to PDF Web Page to Image PDF Split PDF Merge Latex Equation Editor Sci2ools
    Document Tools
    PDF to Text PDF to Postscript PDF to Thumbnails Excel to PDF Word to PDF Postscript to PDF PowerPoint to PDF Latex to Word Repair Corrupted PDF
    Image Tools
    JPG to PS JPG to PDF Extract Images from PDF Image Converter
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2024, USA.