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TCAD
2010
102views more  TCAD 2010»
12 years 11 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
DATE
2010
IEEE
149views Hardware» more  DATE 2010»
13 years 9 months ago
Efficient decision ordering techniques for SAT-based test generation
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model chec...
Mingsong Chen, Xiaoke Qin, Prabhat Mishra