parametric yield prediction

DAC
2003
ACM

154views Computer Architecture» more DAC 2003»

14 years 5 months ago

In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important as...

Chandu Visweswariah

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DAC
2003
ACM

127views Computer Architecture» more DAC 2003»

Statistical timing for parametric yield prediction of digital integrated circuits

14 years 5 months ago

Download www.research.ibm.com

Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, ...

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