ET
2000
13 years 4 months ago
2000
An efficient deterministic BIST scheme based on partial scan chains together with a scan selection algorithm tailored for BIST is presented. The algorithm determines a minimum num...
CLA
2004
13 years 6 months ago
2004
We discuss in this paper several approaches exploiting a base of concepts organized under a lattice in the Fuzzy Classifier by Concept Localization (FC2L) system. We present the 3F...
ICCAD
1996
IEEE
13 years 8 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...