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    DSD
    2009
    IEEE
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    On the Risk of Fault Coupling over the Chip Substrate
    13 years 8 months ago
    On the Risk of Fault Coupling over the Chip Substrate
    Download  www.vmars.tuwien.ac.at
    —Duplication and comparison has proven to be an efficient method for error detection. Based on this generic principle dual core processor architectures with output comparison ar...
    Peter Tummeltshammer, Andreas Steininger
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