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    ISCAS
    2005
    IEEE
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    A test strategy for time-to-digital converters using dynamic element matching and dithering
    13 years 11 months ago
    A test strategy for time-to-digital converters using dynamic element matching and dithering
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    This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic ...
    Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger...
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