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    2003
    IEEE
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    A Case Study of IR-Drop in Structured At-Speed Testing
    13 years 10 months ago
    A Case Study of IR-Drop in Structured At-Speed Testing
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    At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
    Jayashree Saxena, Kenneth M. Butler, Vinay B. Jaya...
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