DSN
2004
IEEE
13 years 8 months ago
2004
IEEE
The relentless scaling of CMOS technology has provided a steady increase in processor performance for the past three decades. However, increased power densities (hence temperature...
ISPASS
2008
IEEE
13 years 11 months ago
2008
IEEE
Abstract— This work concerns metrics for evaluating microarchitectural enhancements to improve processor lifetime reliability. A commonly reported reliability metric is mean time...