Sciweavers

ASPDAC
2008
ACM
103views Hardware» more  ASPDAC 2008»
13 years 6 months ago
Reliability-aware design for nanometer-scale devices
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
David Atienza, Giovanni De Micheli, Luca Benini, J...