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DATE
1997
IEEE
75views Hardware» more  DATE 1997»
13 years 9 months ago
Random benchmark circuits with controlled attributes
Two major improvements, controlled fan-in and automated initial-circuit production, were made over the random generator of benchmark circuits presented at DAC'94. This is an ...
Kazuo Iwama, Kensuke Hino, Hiroyuki Kurokawa, Suna...