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ISQED
2006
IEEE
259views Hardware» more  ISQED 2006»
10 years 5 months ago
Impact of NBTI on SRAM Read Stability and Design for Reliability
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
ISCAS
2007
IEEE
132views Hardware» more  ISCAS 2007»
10 years 6 months ago
High Read Stability and Low Leakage Cache Memory Cell
- Data in conventional six transistor (6T) static random access memory (SRAM) cells are vulnerable to noise due to the direct access to the data storage nodes through the bit lines...
Zhiyu Liu, Volkan Kursun
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