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    DFT
    2007
    IEEE
    86views VLSI» more  DFT 2007»
    Production Yield and Self-Configuration in the Future Massively Defective Nanochips
    13 years 11 months ago
    Production Yield and Self-Configuration in the Future Massively Defective Nanochips
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    We address two problems in this work, namely, 1) the resilience challenge in the future chips made up of massively defective nanoelements and organized in replicative multicore ar...
    Piotr Zajac, Jacques Henri Collet
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