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DFT
2008
IEEE
86views VLSI» more  DFT 2008»
10 years 9 months ago
Enhancing Silicon Debug via Periodic Monitoring
Scan-based debug methods give high observability of internal signals, however, they require halting the system to scan out responses from the circuit-under-debug (CUD). This is ti...
Joon-Sung Yang, Nur A. Touba
books